Scanning Electron Microscopy and X-Ray Microanalysis [4th ed.] 149396674X, 9781493966745

This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive intro

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Table of contents :
Front Matter ....Pages I-XXIII
Electron Beam—Specimen Interactions: Interaction Volume (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 1-14
Backscattered Electrons (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 15-28
Secondary Electrons (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 29-37
X-Rays (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 39-63
Scanning Electron Microscope (SEM) Instrumentation (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 65-91
Image Formation (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 93-110
SEM Image Interpretation (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 111-121
The Visibility of Features in SEM Images (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 123-131
Image Defects (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 133-146
High Resolution Imaging (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 147-164
Low Beam Energy SEM (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 165-172
Variable Pressure Scanning Electron Microscopy (VPSEM) (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 173-185
ImageJ and Fiji (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 187-193
SEM Imaging Checklist (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 195-200
SEM Case Studies (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 201-207
Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 209-234
DTSA-II EDS Software (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 235-264
Qualitative Elemental Analysis by Energy Dispersive X-Ray Spectrometry (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 265-287
Quantitative Analysis: From k-ratio to Composition (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 289-307
Quantitative Analysis: The SEM/EDS Elemental Microanalysis k-ratio Procedure for Bulk Specimens, Step-by-Step (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 309-339
Trace Analysis by SEM/EDS (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 341-357
Low Beam Energy X-Ray Microanalysis (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 359-380
Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 381-411
Compositional Mapping (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 413-439
Attempting Electron-Excited X-Ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VPSEM) (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 441-459
Energy Dispersive X-Ray Microanalysis Checklist (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 461-470
X-Ray Microanalysis Case Studies (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 471-479
Cathodoluminescence (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 481-489
Characterizing Crystalline Materials in the SEM (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 491-515
Focused Ion Beam Applications in the SEM Laboratory (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 517-528
Ion Beam Microscopy (Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy)....Pages 529-539
Back Matter ....Pages 541-550

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