Scanning Electrochemical Microscopy [1 ed.] 0824704711, 9780824704711

Scanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and De

390 2 12MB Read more

Scanning Electron Microscopy in Archaeology 9780860545798, 9781407347370

170 49 184MB Read more

Biological low voltage field emission scanning electron microscopy 9780387729701, 0387729704

Major improvements in instrumentation and specimen preparation have brought SEM to the fore as a biological imaging tech

400 103 9MB Read more

Introduction to Scanning Tunneling Microscopy [3 ed.] 9780198856559, 0198856555

511 91 9MB Read more

Scanning Probe Microscopy: The Lab on a Tip 9783030370893, 3030370895

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe mi

686 61 21MB Read more

Scanning Force Microscopy of Polymers (Springer Laboratory) 3642012302, 9783642012303

Scope of the Book Synthetic and natural polymers exhibit a complex structural and morphological hierarchy on multiple le

99 96 10MB Read more

Scanning Ion Conductance Microscopy (Bioanalytical Reviews, 3) 3031144422, 9783031144424

This book provides a selection of recent developments in scanning ion conductance microscopy (SICM) technology and appli

97 75 11MB Read more

Exploring Scanning Probe Microscopy with MATHEMATICA [2 ed.] 9783527406173, 3527406174

This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, r

358 111 2MB Read more

Scanning Microscopy for Nanotechnology: Techniques and Applications [1 ed.] 0387333258, 9780387333250, 9780387396200

Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with

387 95 2MB Read more

Scanning Probe Microscopy in Nanoscience and Nanotechnology [1 ed.] 3642035345, 9783642035340

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. I

472 73 21MB Read more