Nanoscale Spectroscopy and Its Applications to Semiconductor Research [1 ed.] 3540433120, 9783540433125
Fabrication technologies for nanostructured devices have be- en developed recently, and the electrical and optical pro-
230 80 3MB
English Pages 308 [296] Year 2002
Table of contents :
Introduction....Pages 1-7
Spectro-microscopy by TEM-SEM....Pages 11-23
Determination of Nanosize Particle Distribution by Low Frequency Raman Scattering: Comparison to Electron Microscopy....Pages 24-36
Development of Cathodoluminescence (CL) for Semiconductor Research, Part I: TEM-CL Study of Microstructures and Defects in Semiconductor Epilayers....Pages 37-51
Development of CL for Semiconductor Research, Part II: Cathodoluminescence Study of Semiconductor Nanoparticles and Nanostructures Using Low-Electron-Beam Energies....Pages 52-60
Development of CL for Semiconductor Research, Part III: Study of Degradation Mechanisms in Compound Semiconductor-Based Devices by SEM-CL....Pages 61-73
Microcharacterization of Conformal GaAs on Si Layers by Spatially Resolved Optical Techniques....Pages 74-81
Strain Analysis in Submicron Electron Devices by Convergent Beam Electron Diffraction....Pages 82-90
Synchrotron Radiation X-ray Microscopy Based on Zone Plate Optics....Pages 93-110
Long-Term Oxidation Behaviour of Lead Sulfide Surfaces....Pages 111-120
Cross-Sectional Photoemission Spectromicroscopy of Semiconductor Heterostructures....Pages 121-130
Surface Imaging Using Electrons Excited by Metastable-Atom Impacts....Pages 131-144
Application of Photoemission Electron Microscopy to Magnetic Domain Imaging....Pages 145-156
Photoelectron Spectroscopy with a Photoemission Electron Microscope....Pages 157-171
X-ray Photoemission and Low-Energy Electron Microscope....Pages 172-179
Application of Imaging-Type Photoelectron Spectromicroscopy to Solid-State Physics....Pages 180-195
Scanning Near-Field Optical Spectroscopy of Quantum-Confined Semiconductor Nanostructures....Pages 199-209
Novel Tuning Fork Sensor for Low-Temperature Near-Field Spectroscopy....Pages 210-221
Manipulating, Reacting, and Constructing Single Molecules with a Scanning Tunneling Microscope Tip....Pages 222-230
Electron-Beam-Induced Decomposition of SiO 2 Overlay on Si in STM Nanolithography....Pages 231-240
Direct Imaging of InGaAs Quantum Dot States by Scanning Tunneling Spectroscopy....Pages 241-251
Growth and Characterization of Ge Nanostructures on Si(111)....Pages 252-262
Imaging of Zero-Dimensional States in Semiconductor Nanostructures Using Scanning Tunneling Microscopy....Pages 263-268
Electronic-Excitation-Induced Enhancement in Metallicity on HOPG and Si Surfaces: In Situ STM/STS Studies....Pages 269-277
Electronic Properties of Polycrystalline and Amorphous WO 3 Investigated with Scanning Tunnelling Spectroscopy....Pages 278-286
Probing of Electronic Transitions with Atomic-Scale Spatial Resolution in Semiconductor Quantum Well Structures....Pages 287-293
Scanning Tunneling Microscope-Induced Light Emission from Nanoscale Structures....Pages 294-304
Introduction....Pages 1-7
Spectro-microscopy by TEM-SEM....Pages 11-23
Determination of Nanosize Particle Distribution by Low Frequency Raman Scattering: Comparison to Electron Microscopy....Pages 24-36
Development of Cathodoluminescence (CL) for Semiconductor Research, Part I: TEM-CL Study of Microstructures and Defects in Semiconductor Epilayers....Pages 37-51
Development of CL for Semiconductor Research, Part II: Cathodoluminescence Study of Semiconductor Nanoparticles and Nanostructures Using Low-Electron-Beam Energies....Pages 52-60
Development of CL for Semiconductor Research, Part III: Study of Degradation Mechanisms in Compound Semiconductor-Based Devices by SEM-CL....Pages 61-73
Microcharacterization of Conformal GaAs on Si Layers by Spatially Resolved Optical Techniques....Pages 74-81
Strain Analysis in Submicron Electron Devices by Convergent Beam Electron Diffraction....Pages 82-90
Synchrotron Radiation X-ray Microscopy Based on Zone Plate Optics....Pages 93-110
Long-Term Oxidation Behaviour of Lead Sulfide Surfaces....Pages 111-120
Cross-Sectional Photoemission Spectromicroscopy of Semiconductor Heterostructures....Pages 121-130
Surface Imaging Using Electrons Excited by Metastable-Atom Impacts....Pages 131-144
Application of Photoemission Electron Microscopy to Magnetic Domain Imaging....Pages 145-156
Photoelectron Spectroscopy with a Photoemission Electron Microscope....Pages 157-171
X-ray Photoemission and Low-Energy Electron Microscope....Pages 172-179
Application of Imaging-Type Photoelectron Spectromicroscopy to Solid-State Physics....Pages 180-195
Scanning Near-Field Optical Spectroscopy of Quantum-Confined Semiconductor Nanostructures....Pages 199-209
Novel Tuning Fork Sensor for Low-Temperature Near-Field Spectroscopy....Pages 210-221
Manipulating, Reacting, and Constructing Single Molecules with a Scanning Tunneling Microscope Tip....Pages 222-230
Electron-Beam-Induced Decomposition of SiO 2 Overlay on Si in STM Nanolithography....Pages 231-240
Direct Imaging of InGaAs Quantum Dot States by Scanning Tunneling Spectroscopy....Pages 241-251
Growth and Characterization of Ge Nanostructures on Si(111)....Pages 252-262
Imaging of Zero-Dimensional States in Semiconductor Nanostructures Using Scanning Tunneling Microscopy....Pages 263-268
Electronic-Excitation-Induced Enhancement in Metallicity on HOPG and Si Surfaces: In Situ STM/STS Studies....Pages 269-277
Electronic Properties of Polycrystalline and Amorphous WO 3 Investigated with Scanning Tunnelling Spectroscopy....Pages 278-286
Probing of Electronic Transitions with Atomic-Scale Spatial Resolution in Semiconductor Quantum Well Structures....Pages 287-293
Scanning Tunneling Microscope-Induced Light Emission from Nanoscale Structures....Pages 294-304
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- G. Salviati
- Y. Watanabe (auth.)
- Yoshio Watanabe
- Giancarlo Salviati
- Stefan Heun
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