Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits 0792379918, 9780792379911, 9780306470400

Todays electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-si

1,892 208 34MB

English Pages 713 Year 2000

Recommend Papers

Vlsi Design Techniques for Analog and Digital Circuits 0070232539, 9780070232532

Книга Vlsi Design Techniques for Analog and Digital Circuits Vlsi Design Techniques for Analog and Digital CircuitsКниги

745 78 11KB Read more

VLSI. Design Techniques for Analog and Digital Circuits

759 103 10KB Read more

Solutions to Problems from Essentials of Electronic Testing

508 116 2MB Read more

Electronic Circuits for the Hobbyist

579 140 12MB Read more

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [2nd ed.] 9781580535373, 1580535372

Failures of nano-metric technologies owing to defects and shrinking process tolerances give rise to significant challeng

383 95 5MB Read more

Electronic Circuits Handbook for Design and Application

This book is written for students, practicing engineers and scientists. It covers all important aspects of analog and di

608 32 307KB Read more

Electronic circuits and tubes

509 98 22KB Read more

Lessons in Electronic Circuits - Digital [vol 4, 4 ed.]

414 90 2MB Read more

Circuits, Interconnections, and Packaging for Vlsi 0201060086, 9780201060089

551 117 5MB Read more

Analog and Digital Circuits for Electronic Ctl Sys Apps 9780750678100, 0750678100

Today's control system designers face an ever-increasing "need for speed" and accuracy in their system me

335 75 3MB Read more

Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits
0792379918, 9780792379911, 9780306470400

Author / Uploaded
M. Bushnell
Vishwani Agrawal

Similar Topics
Technique
Electronics

0 0 0
Like this paper and download? You can publish your own PDF file online for free in a few minutes! Sign Up

File loading please wait...

Citation preview

ESSENTIALS OF ELECTRONIC TESTING FOR DIGITAL, MEMORY AND MIXED-SIGNAL VLSI CIRCUITS

FRONTIERS IN ELECTRONIC TESTING Consulting Editor Vishwani D. Agrawal Books in the series: Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard A. Osseiran ISBN: 0-7923-8686-8 Design for At-Speed Test, Diagnosis and Measurement B. Nadeau-Dosti ISBN: 0-79-8669-8 Delay Fault Testing for VLSI Circuits A. K-T. Cheng ISBN: 0-7923-8295-1 Research Perspectives and Case Studies in System Test and Diagnosis J.W. Sheppard, W.R. Simpson ISBN: 0-7923-8263-3 Formal Equivalence Checking and Design Debugging S.-Y. Huang, K.-T. Cheng ISBN: 0-7923-8184-X On-Line Testing for VLSI M. Nicolaidis, Y. Zorian ISBN: 0-7923-8132-7 Defect Oriented Testing for CMOS Analog and Digital Circuits M. Sachdev ISBN: 0-7923-8083-5 Reasoning in Boolean Networks: Logic Synthesis and Verification Using Testing Techniques W. Kunz, D. Stoffel ISBN: 0-7923-9921-8 Introduction to IDDQTesting S. Chakravarty, P.J. Thadikaran ISBN: 0-7923-9945-5 Multi-Chip Module Test Strategies Y. Zorian ISBN: 0-7923-9920-X Testing and Testable Design of High-Density Random-Access Memories P. Mazumder, K. Chakraborty ISBN: 0-7923-9782-7 From Contamination to Defects, Faults and Yield Loss J.B. Khare, W. Maly ISBN: 0-7923-9714-2

ESSENTIALS OF ELECTRONIC TESTING FOR DIGITAL, MEMORY AND MIXED-SIGNAL VLSI CIRCUITS

Michael L. Bushnell Rutgers University

Vishwani D. Agrawal Bell Labs, Lucent Technologies.

KLUWER ACADEMIC PUBLISHERS NEW YORK, BOSTON, DORDRECHT, LONDON, MOSCOW

H%RRN ,6%1 3ULQW,6%1

70403 792379918

.OXZHU$FDGHPLF3XEOLVKHUV 1HZ